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Fingerprint Fingerprint is based on mining the text of the experts' scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

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Costs Engineering & Materials Science
Integrated circuits Engineering & Materials Science
Testing Engineering & Materials Science
Intellectual property Engineering & Materials Science
Hardware Engineering & Materials Science
Compaction Engineering & Materials Science
Networks (circuits) Engineering & Materials Science
Reverse engineering Engineering & Materials Science

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Research Output 2001 2019

ScanSaT: Unlocking obfuscated scan chains

Alrahis, L., Yasin, M., Saleh, H., Mohammad, B., Al-Qutayri, M. & Sinanoglu, O., Jan 21 2019, ASP-DAC 2019 - 24th Asia and South Pacific Design Automation Conference. Institute of Electrical and Electronics Engineers Inc., p. 388-393 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Outsourcing
Semiconductor materials
Networks (circuits)
Testing
Industry
Hall effect devices
Spin Hall effect
Probabilistic logics
Low power electronics
Logic gates

Towards Provably Secure Logic Locking for Hardening Hardware Security Dissertation Summary: IEEE TTTC E.J. McCluskey Doctoral Thesis Award Competition

Yasin, M. & Sinanoglu, O., Jan 23 2019, International Test Conference 2018, ITC 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 8624809. (Proceedings - International Test Conference; vol. 2018-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Locking
Hardening
Hardware
Logic
Reverse engineering

Advancing hardware security using polymorphic and stochastic spin-hall effect devices

Patnaik, S., Rangarajan, N., Knechtel, J., Sinanoglu, O. & Rakheja, S., Apr 19 2018, Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018. Institute of Electrical and Electronics Engineers Inc., Vol. 2018-January. p. 97-102 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hall effect devices
Spin Hall effect
Intellectual property
Switches
Boolean functions

ATPG-based cost-effective, secure logic locking

Sengupta, A., Nabeel, M., Yasin, M. & Sinanoglu, O., May 29 2018, Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018. IEEE Computer Society, Vol. 2018-April. p. 1-6 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Costs
Reverse engineering
Supply chains
Hardware
Testing