TY - GEN
T1 - A 600mVPP-Input-Range 94.5dB-SNDR NS-SAR-Nested DSM with 4th-Order Truncation-Error Shaping and Input-Impedance Boosting for Biosignal Acquisition
AU - Jeong, Kyeongwon
AU - Yun, Gichan
AU - Ha, Sohmyung
AU - Je, Minkyu
N1 - Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - We present a 600mVPP-linear-input-range 94.5dB-SNDR NS-SAR-based DSM with input-impedance (ZIN) boosting for biopotential recording. The proposed direct-conversion ADC utilizes a 1st-order DSM to widen the input range and a 2nd-order noise-shaping SAR (NS-SAR) ADC for high resolution and power efficiency. Also, by feeding the truncation (TRNC) error back to the NS-SAR ADC, the error is shaped in the 4th order, further lowering the noise. Fabricated in 65nm CMOS, the NS-SAR-nested DSM achieves 208MO ZIN at DC, 174.3dB FOMSNDR, and 175.6dB FOMDR, consuming 5.2W.
AB - We present a 600mVPP-linear-input-range 94.5dB-SNDR NS-SAR-based DSM with input-impedance (ZIN) boosting for biopotential recording. The proposed direct-conversion ADC utilizes a 1st-order DSM to widen the input range and a 2nd-order noise-shaping SAR (NS-SAR) ADC for high resolution and power efficiency. Also, by feeding the truncation (TRNC) error back to the NS-SAR ADC, the error is shaped in the 4th order, further lowering the noise. Fabricated in 65nm CMOS, the NS-SAR-nested DSM achieves 208MO ZIN at DC, 174.3dB FOMSNDR, and 175.6dB FOMDR, consuming 5.2W.
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U2 - 10.1109/VLSITechnologyandCir46769.2022.9830401
DO - 10.1109/VLSITechnologyandCir46769.2022.9830401
M3 - Conference contribution
AN - SCOPUS:85135204036
T3 - Digest of Technical Papers - Symposium on VLSI Technology
SP - 52
EP - 53
BT - 2022 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2022
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2022 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2022
Y2 - 12 June 2022 through 17 June 2022
ER -