A Comprehensive Design-for-Test Infrastructure in the Context of Security-Critical Applications

Samah Mohamed Saeed; Ozgur Sinanoglu

doi:10.1109/MDAT.2016.2527708

A Comprehensive Design-for-Test Infrastructure in the Context of Security-Critical Applications

Research output: Contribution to journal › Article › peer-review

Abstract

Editor's note: Testability is a perennial concern that requires ever-improved solutions; however, potentially resultant security vulnerabilities need to be considered as well. This article provides a compact look at a body of DfT work from lead practitioners in the field. The DfT strategies address predicting and controlling test data volume and reducing power. Potential impacts of DfT to security are considered, along with strategies for providing testability without sacrificing security.

Original language	English (US)
Article number	7403884
Pages (from-to)	57-64
Number of pages	8
Journal	IEEE Design and Test
Volume	34
Issue number	1
DOIs	https://doi.org/10.1109/MDAT.2016.2527708
State	Published - Feb 2017

Keywords

Design-for-testability
Hardware security
Low power test
Scan attack

ASJC Scopus subject areas

Software
Hardware and Architecture
Electrical and Electronic Engineering

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10.1109/MDAT.2016.2527708

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A Comprehensive Design-for-Test Infrastructure in the Context of Security-Critical Applications

Abstract

Keywords

ASJC Scopus subject areas

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