A Comprehensive Design-for-Test Infrastructure in the Context of Security-Critical Applications

Samah Mohamed Saeed, Ozgur Sinanoglu

Research output: Contribution to journalArticle

Abstract

Editor's note: Testability is a perennial concern that requires ever-improved solutions; however, potentially resultant security vulnerabilities need to be considered as well. This article provides a compact look at a body of DfT work from lead practitioners in the field. The DfT strategies address predicting and controlling test data volume and reducing power. Potential impacts of DfT to security are considered, along with strategies for providing testability without sacrificing security.

Original languageEnglish (US)
Article number7403884
Pages (from-to)57-64
Number of pages8
JournalIEEE Design and Test
Volume34
Issue number1
DOIs
StatePublished - Feb 2017

Keywords

  • Design-for-testability
  • Hardware security
  • Low power test
  • Scan attack

ASJC Scopus subject areas

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering

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