Abstract
We present a convolutional approach to reflection symmetry detection in 2D. Our model, built on the products of complex-valued wavelet convolutions, simplifies previous edge-based pairwise methods. Being parameter-centered, as opposed to feature-centered, it has certain computational advantages when the object sizes are known a priori, as demonstrated in an ellipse detection application. The method outperforms the best-performing algorithm on the CVPR 2013 Symmetry Detection Competition Database in the single-symmetry case. We release code and a new, larger image database.
Original language | English (US) |
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Pages (from-to) | 44-50 |
Number of pages | 7 |
Journal | Pattern Recognition Letters |
Volume | 95 |
DOIs | |
State | Published - Aug 1 2017 |
Keywords
- Mirror symmetry
- Reflection symmetry
ASJC Scopus subject areas
- Software
- Signal Processing
- Computer Vision and Pattern Recognition
- Artificial Intelligence