A dissimilarity measure for comparing origami crease patterns

Seung Man Oh, Godfried T. Toussaint, Erik D. Demaine, Martin L. Demaine

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A measure of dissimilarity (distance) is proposed for comparing origami crease patterns represented as geometric graphs. The distance measure is determined by minimum-weight matchings calculated between the edges as well as the vertices of the graphs being compared. The distances between pairs of edges and pairs of vertices of the graph are weighted linear combinations of six parameters that constitute geometric features of the edges and vertices. The results of a preliminary study performed with a collection of 45 crease patterns obtained from Mitani's ORIPA web page, revealed which of these features appear to be more salient for obtaining a clustering of the crease patterns that appears to agree with human intuition.

Original languageEnglish (US)
Title of host publicationICPRAM 2015 - 4th International Conference on Pattern Recognition Applications and Methods, Proceedings
EditorsMaria De Marsico, Mario Figueiredo, Ana Fred
PublisherSciTePress
Pages386-391
Number of pages6
ISBN (Electronic)9789897580765
DOIs
StatePublished - 2015
Event4th International Conference on Pattern Recognition Applications and Methods, ICPRAM 2015 - Lisbon, Portugal
Duration: Jan 10 2015Jan 12 2015

Publication series

NameICPRAM 2015 - 4th International Conference on Pattern Recognition Applications and Methods, Proceedings
Volume1

Other

Other4th International Conference on Pattern Recognition Applications and Methods, ICPRAM 2015
CountryPortugal
CityLisbon
Period1/10/151/12/15

Keywords

  • Computational origami
  • Crease patterns
  • Geometric graphs
  • Graph similarity
  • Phylogenetic trees

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition

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  • Cite this

    Oh, S. M., Toussaint, G. T., Demaine, E. D., & Demaine, M. L. (2015). A dissimilarity measure for comparing origami crease patterns. In M. De Marsico, M. Figueiredo, & A. Fred (Eds.), ICPRAM 2015 - 4th International Conference on Pattern Recognition Applications and Methods, Proceedings (pp. 386-391). (ICPRAM 2015 - 4th International Conference on Pattern Recognition Applications and Methods, Proceedings; Vol. 1). SciTePress. https://doi.org/10.5220/0005291203860393