A domain-knowledge-inspired mathematical framework for the description and classification of H&E stained histopathology images

Melody L. Massar, Ramamurthy Bhagavatula, John A. Ozolek, Carlos A. Castro, Matthew Fickus, Jelena Kovačević

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present the current state of our work on a mathematical framework for identification and delineation of histopathology images-local histograms and occlusion models. Local histograms are histograms computed over defined spatial neighborhoods whose purpose is to characterize an image locally. This unit of description is augmented by our occlusion models that describe a methodology for image formation. In the context of this image formation model, the power of local histograms with respect to appropriate families of images will be shown through various proved statements about expected performance. We conclude by presenting a preliminary study to demonstrate the power of the framework in the context of histopathology image classification tasks that, while differing greatly in application, both originate from what is considered an appropriate class of images for this framework.

Original languageEnglish (US)
Title of host publicationWavelets and Sparsity XIV
DOIs
StatePublished - 2011
EventWavelets and Sparsity XIV - San Diego, CA, United States
Duration: Aug 21 2011Aug 24 2011

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8138
ISSN (Print)0277-786X

Other

OtherWavelets and Sparsity XIV
Country/TerritoryUnited States
CitySan Diego, CA
Period8/21/118/24/11

Keywords

  • classification
  • local histogram
  • occlusion
  • segmentation
  • texture

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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