A Fine-Grained Soft Error Resilient Architecture under Power Considerations

Sajjad Hussain, Muhammad Shafique, Jörg Henkel

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Besides the limited power budgets and the darksilicon issue, soft error is one of the most critical reliability issues in computing systems fabricated using nano-scale devices. During the execution, different applications have varying performance, power/energy consumption and vulnerability properties. Different trade-offs can be devised to provide required resiliency within the allowed power constraints. To exploit this behavior, we propose a novel soft error resilient architecture and the corresponding run-time system that enables power-aware finegrained resiliency for different processor components. It selectively determines the reliability state of various components, such that the overall application reliability is improved under a given power budget. Our architecture saves power up to 16% and reliability degradation up to 11% compared to state-of-the-art techniques.

Original languageEnglish (US)
Title of host publicationProceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages972-975
Number of pages4
ISBN (Electronic)9783981926323
DOIs
StatePublished - May 14 2019
Event22nd Design, Automation and Test in Europe Conference and Exhibition, DATE 2019 - Florence, Italy
Duration: Mar 25 2019Mar 29 2019

Publication series

NameProceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019

Conference

Conference22nd Design, Automation and Test in Europe Conference and Exhibition, DATE 2019
CountryItaly
CityFlorence
Period3/25/193/29/19

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Control and Optimization

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