TY - JOUR
T1 - A Golden-Free Approach to Detect Trojans in COTS Multi-PCB Systems
AU - Chowdhury, Animesh Basak
AU - Mahapatra, Anushree
AU - Liu, Yang
AU - Krishnamurthy, Prashanth
AU - Khorrami, Farshad
AU - Karri, Ramesh
N1 - Publisher Copyright:
© 1981-2012 IEEE.
PY - 2023/9/1
Y1 - 2023/9/1
N2 - Untrusted third parties in commercial-off-the-shelf (COTS) printed circuit board (PCB) supply chains may poison PCBs with hardware, firmware, and software implants. Hence, we focus on detection of malicious implants in PCBs. State-of-the-art hardware Trojan detection methods require a golden PCB system/model to detect malicious implants and do not scale to large-scale COTS PCB systems. We map a COTS PCB system to a graph and propose a golden-free methodology comprising a graph-based mathematical construction on node and edge equivalences, and clustering of identical nodes and paths and validation of hypothesized statistical properties on measured sidechannel data. We evaluate the methodology on a multi-PCB testbed with hierarchically networked PCB devices and several types of Trojans.
AB - Untrusted third parties in commercial-off-the-shelf (COTS) printed circuit board (PCB) supply chains may poison PCBs with hardware, firmware, and software implants. Hence, we focus on detection of malicious implants in PCBs. State-of-the-art hardware Trojan detection methods require a golden PCB system/model to detect malicious implants and do not scale to large-scale COTS PCB systems. We map a COTS PCB system to a graph and propose a golden-free methodology comprising a graph-based mathematical construction on node and edge equivalences, and clustering of identical nodes and paths and validation of hypothesized statistical properties on measured sidechannel data. We evaluate the methodology on a multi-PCB testbed with hierarchically networked PCB devices and several types of Trojans.
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U2 - 10.1109/MM.2023.3300713
DO - 10.1109/MM.2023.3300713
M3 - Article
AN - SCOPUS:85166770788
SN - 0272-1732
VL - 43
SP - 64
EP - 76
JO - IEEE Micro
JF - IEEE Micro
IS - 5
ER -