A High-throughput Impedance Measurement IC with Baseline-Canceling Peak Detector

Asra Malik, Soon Jae Kweon, Karam Ellahi, Muhammad Abrar Akram, Song I. Cheon, Yoontae Jung, Minkyu Je, Hammad M. Cheema, Sohmyung Ha

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents a novel high-throughput impedance measurement integrated circuit (IC) with baseline cancellation for neural EIT applications. The proposed technique uses a peak detector to obtain impedance magnitude every cycle. After taking the peak, the peak detector is reset to a DC baseline voltage. And, the signal swinging between the amplitude and the reset baseline is further amplified, allowing to measure small impedance variations even with a large baseline. The proposed IC fabricated in a 180-nm standard CMOS process can measure impedance variations of >0.1% baseline can be measured, while achieving high throughput of 100 kS/s at 100 kHz input frequency. Scalable design allows the proposed IC to support a wide frequency range from 100 Hz to 100 kHz with a power consumption from 31 μW to 39 μW from a 1.2-V supply.

Original languageEnglish (US)
Title of host publicationISCAS 2024 - IEEE International Symposium on Circuits and Systems
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350330991
DOIs
StatePublished - 2024
Event2024 IEEE International Symposium on Circuits and Systems, ISCAS 2024 - Singapore, Singapore
Duration: May 19 2024May 22 2024

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310

Conference

Conference2024 IEEE International Symposium on Circuits and Systems, ISCAS 2024
Country/TerritorySingapore
CitySingapore
Period5/19/245/22/24

Keywords

  • Neural EIT
  • baseline cancellation
  • frame rate
  • high throughput
  • low power
  • peak detection

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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