TY - JOUR
T1 - A Kronecker Product Model for Repeated Pattern Detection on 2D Urban Images
AU - Liu, Juan
AU - Psarakis, Emmanouil Z.
AU - Feng, Yang
AU - Stamos, Ioannis
N1 - Funding Information:
We thank the editor, the AE and two anonymous referees for the insightful comments which has greatly improved the paper. Feng was partially supported by NSF CAREER Grant DMS-1554804. Sta-mos was partially supported by NSF Grant IIS-0915971 and CUNY bridge funding.
Publisher Copyright:
© 2018 IEEE.
PY - 2019/9/1
Y1 - 2019/9/1
N2 - Repeated patterns (such as windows, balconies, and doors) are prominent and significant features in urban scenes. Therefore, detection of these repeated patterns becomes very important for city scene analysis. This paper attacks the problem of repeated pattern detection in a precise, efficient and automatic way, by combining traditional feature extraction with a Kronecker product based low-rank model. We introduced novel algorithms that extract repeated patterns from rectified images with solid theoretical support. Our method is tailored for 2D images of building façades and tested on a large set of façade images.
AB - Repeated patterns (such as windows, balconies, and doors) are prominent and significant features in urban scenes. Therefore, detection of these repeated patterns becomes very important for city scene analysis. This paper attacks the problem of repeated pattern detection in a precise, efficient and automatic way, by combining traditional feature extraction with a Kronecker product based low-rank model. We introduced novel algorithms that extract repeated patterns from rectified images with solid theoretical support. Our method is tailored for 2D images of building façades and tested on a large set of façade images.
KW - Kronecker product model
KW - Repeated pattern detection
KW - low-rank
KW - urban façade
UR - http://www.scopus.com/inward/record.url?scp=85050374845&partnerID=8YFLogxK
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U2 - 10.1109/TPAMI.2018.2858795
DO - 10.1109/TPAMI.2018.2858795
M3 - Article
C2 - 30040628
AN - SCOPUS:85050374845
SN - 0162-8828
VL - 41
SP - 2266
EP - 2272
JO - IEEE Transactions on Pattern Analysis and Machine Intelligence
JF - IEEE Transactions on Pattern Analysis and Machine Intelligence
IS - 9
ER -