A multi-criteria integrated probabilistic voltage vulnerability assessment method

Yuzhang Lin, Libao Shi, Zhou Jian, Liangzhong Yao, Xiaofeng Lin, Bazargan Masoud

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Conventional voltage vulnerability assessment methods and indices as well as weak area identification are one-sided and inconsistent with each other. Specially most of solutions are deterministic without considering the uncertainties in nature. Based on Super-Efficiency Data Envelopment Analysis (SEDEA) model, a multi-criteria integrated probabilistic voltage vulnerability assessment method is proposed in this paper. Three voltage vulnerability indices are selected for the assessment. Two integrated indices obtained by SEDEA model, Mean Voltage Vulnerability Index (MVVI) and Deviation Voltage Vulnerability Index (DVVI), are used to indicate the mean and deviation degree of bus voltage vulnerability respectively. By performing numerical simulations on IEEE standard test system, it can be concluded that the proposed method and indices are able to identify weak load buses comprehensively, effectively and objectively with random factors taken into account.

Original languageEnglish (US)
Title of host publication2013 IEEE Power and Energy Society General Meeting, PES 2013
DOIs
StatePublished - 2013
Event2013 IEEE Power and Energy Society General Meeting, PES 2013 - Vancouver, BC, Canada
Duration: Jul 21 2013Jul 25 2013

Publication series

NameIEEE Power and Energy Society General Meeting
ISSN (Print)1944-9925
ISSN (Electronic)1944-9933

Conference

Conference2013 IEEE Power and Energy Society General Meeting, PES 2013
Country/TerritoryCanada
CityVancouver, BC
Period7/21/137/25/13

Keywords

  • Data Envelopment Analysis
  • Monte Carlo Simulation
  • Voltage Stability
  • Vulnerability Assessment
  • Weak Bus

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Nuclear Energy and Engineering
  • Renewable Energy, Sustainability and the Environment
  • Electrical and Electronic Engineering

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