A novel technique for preparation of tunnel junction barriers using electrochemicaly anodization

S. A. Wolf, P. M. Chaikin

    Research output: Contribution to journalArticlepeer-review

    Abstract

    A novel method has been developed for preparing both Josephson and single particle’ tunnel junctions. This technique has been extensive1y applied to Sn-SnxOymetal films where the tin oxide barrier is formed on the surface of a freshly evaporated Sn film by electrochemical anodization. By varying the anodization parameters,, the junction resistantes can be controlled over more than three orders of magnitude: I.e., from less than 10–4 ohm-cm2 to 0.1 ohm-cm2.In each instance, high quality junctions with nearly ideal I-V characteristics and low leakage currents have been produced. Low resistance Josephson junctions have been fabricated whose critical currents scale with junction resistance and modulate with applied magnetic field in the familiar Fraunhofer-like diffraction pattern. Sn-SnxOyAgPb proximity effect samples with the oxide barriers prepsred as described above have been used to study magnetic penetration in the Ag layer.1 We hope to extend this technique to prepare junctions using base electrode superconductors. like NbN which then will have considerable technological significance.

    Original languageEnglish (US)
    Pages (from-to)957-959
    Number of pages3
    JournalIEEE Transactions on Magnetics
    Volume19
    Issue number3
    DOIs
    StatePublished - May 1983

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Electrical and Electronic Engineering

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