TY - GEN
T1 - A unified charge-current compact model for ambipolar operation in quasi-ballistic graphene transistors
T2 - 2013 IEEE International Electron Devices Meeting, IEDM 2013
AU - Rakheja, Shaloo
AU - Wang, Han
AU - Palacios, Tomas
AU - Meric, Inanc
AU - Shepard, Kenneth
AU - Antoniadis, Dimitri
PY - 2013
Y1 - 2013
N2 - This paper presents a compact virtual source (VS) model to describe carrier transport valid in both unipolar and ambipolar transport regimes in quasi-ballistic graphene field-effect transistors (GFETs). The model formulation allows for an easy extension to bilayer graphene transistors, where a bandgap can be opened. The model also includes descriptions of intrinsic terminal charges/capacitances obtained self-consistently with the transport formulation. The charge model extends from drift-diffusive transport regime to ballistic transport regime, where gradual-channel approximation (GCA) fails. The model is calibrated exhaustively against DC and S-parameter measurements of GFETs. To demonstrate the model capability for circuit-level simulations, the Verilog-A implementation of the model is used to simulate the dynamic response of frequency doubling circuits with GFETs operating in the ambipolar regime.
AB - This paper presents a compact virtual source (VS) model to describe carrier transport valid in both unipolar and ambipolar transport regimes in quasi-ballistic graphene field-effect transistors (GFETs). The model formulation allows for an easy extension to bilayer graphene transistors, where a bandgap can be opened. The model also includes descriptions of intrinsic terminal charges/capacitances obtained self-consistently with the transport formulation. The charge model extends from drift-diffusive transport regime to ballistic transport regime, where gradual-channel approximation (GCA) fails. The model is calibrated exhaustively against DC and S-parameter measurements of GFETs. To demonstrate the model capability for circuit-level simulations, the Verilog-A implementation of the model is used to simulate the dynamic response of frequency doubling circuits with GFETs operating in the ambipolar regime.
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U2 - 10.1109/IEDM.2013.6724568
DO - 10.1109/IEDM.2013.6724568
M3 - Conference contribution
AN - SCOPUS:84894352626
SN - 9781479923076
T3 - Technical Digest - International Electron Devices Meeting, IEDM
SP - 5.5.1-5.5.4
BT - 2013 IEEE International Electron Devices Meeting, IEDM 2013
Y2 - 9 December 2013 through 11 December 2013
ER -