Abstract
Today, there is a need to simultaneously characterize the N and N*2 fluxes impinging on the substrate to determine the role of precursors during deposition. An overview is given on the use of modulated-beam light-of-sight threshold ionization mass spectrometry (LOS-TIMS) to measure the absolute densities of N and N*2 in an N2 plasma.
Original language | English (US) |
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Pages (from-to) | 4918-4920 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 83 |
Issue number | 24 |
DOIs | |
State | Published - Dec 15 2003 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)