TY - JOUR
T1 - Absolute total and partial cross-sections for the electron impact ionization of TiCl4
AU - Basner, R.
AU - Schmidt, M.
AU - Becker, K.
AU - Tarnovsky, V.
AU - Deutsch, H.
N1 - Funding Information:
This work was supported by the VW-Stiftung (I/69 749). Two of us (V.T. and K. B.) acknowledge partial financial support from the Division of Chemical Sciences, Office of Basic Energy Sciences, Office of Science, US Department of Energy. The authors are grateful for technical assistance provided by Ms U. Haeder.
PY - 2000/10/17
Y1 - 2000/10/17
N2 - Titanium tetrachloride (TiCl4) is used for the plasma-assisted chemical vapor deposition (CVD) of titanium nitride films. We studied the electron impact ionization of TiCl4 for electron energies from threshold to 500 eV. Absolute partial cross-sections for the formation of all singly charged positive ions and for four doubly charged positive ions were measured using a time-of-flight mass spectrometer (TOF-MS), which can be operated either in the linear mode or in the reflection mode. Dissociative ionization was found to be the dominant process. At lower impact energies up to 40 eV, the ion abundance varies drastically with impact energy, whereas at higher energies, two ionization channels dominate, the formation of the TiCl3+ fragment ion with a maximum cross-section of 3.75×10-16 cm2 at 100 eV and the formation of the Cl+ fragment ion with a maximum cross-section of 4×10-16 cm2 at 70 eV. All fragment ions with the exception of TiCl3+ are formed with excess kinetic energy with the Cl+ ion showing the broadest distribution of kinetic energies. The cross-section values of the doubly charged ions are approximately one order of magnitude smaller than those of the singly charged ions. The experimentally determined total single ionization cross-section of TiCl4 is compared with results of semi-empirical calculations and good agreement is found.
AB - Titanium tetrachloride (TiCl4) is used for the plasma-assisted chemical vapor deposition (CVD) of titanium nitride films. We studied the electron impact ionization of TiCl4 for electron energies from threshold to 500 eV. Absolute partial cross-sections for the formation of all singly charged positive ions and for four doubly charged positive ions were measured using a time-of-flight mass spectrometer (TOF-MS), which can be operated either in the linear mode or in the reflection mode. Dissociative ionization was found to be the dominant process. At lower impact energies up to 40 eV, the ion abundance varies drastically with impact energy, whereas at higher energies, two ionization channels dominate, the formation of the TiCl3+ fragment ion with a maximum cross-section of 3.75×10-16 cm2 at 100 eV and the formation of the Cl+ fragment ion with a maximum cross-section of 4×10-16 cm2 at 70 eV. All fragment ions with the exception of TiCl3+ are formed with excess kinetic energy with the Cl+ ion showing the broadest distribution of kinetic energies. The cross-section values of the doubly charged ions are approximately one order of magnitude smaller than those of the singly charged ions. The experimentally determined total single ionization cross-section of TiCl4 is compared with results of semi-empirical calculations and good agreement is found.
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U2 - 10.1016/S0040-6090(00)01143-3
DO - 10.1016/S0040-6090(00)01143-3
M3 - Article
AN - SCOPUS:0034291833
SN - 0040-6090
VL - 374
SP - 291
EP - 297
JO - Thin Solid Films
JF - Thin Solid Films
IS - 2
ER -