ACSEM: Accuracy-configurable fast soft error masking analysis in combinatorial circuits

Florian Kriebel, Semeen Rehman, Duo Sun, Pau Vilimelis Aceituno, Muhammad Shafique, Jorg Henkel

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Small feature sizes and associated low-operating voltages have led to radiation-induced soft errors as a major source of unreliability in modern circuits. As not all errors propagate to the final output of a combinatorial circuit (e.g., because of logical masking effects), an analysis of the error masking characteristics is required to evaluate and enhance the quality of a reliable processor design. State-of-the-art gate-level soft error masking techniques require a significant amount of analysis time due to their inherent nature of parsing and analyzing the complete processor's netlist, which may take up to several days. In this paper, we present a fast and Accuracy-Configurable Soft Error Masking analysis technique (ACSEM) that performs error probability analysis on parts of netlist within the user-provided masking accuracy range. To enable this, we theoretically derive the maximum number of steps in the netlist graph that has to be processed to reach the required masking accuracy level. This significantly reduces the analysis time by orders of magnitude compared to traditional state-of-the art approaches that process all logic gate paths in a given combinatorial circuit.

Original languageEnglish (US)
Title of host publicationProceedings of the 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages824-829
Number of pages6
ISBN (Electronic)9783981537048
DOIs
StatePublished - Apr 22 2015
Event2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015 - Grenoble, France
Duration: Mar 9 2015Mar 13 2015

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
Volume2015-April
ISSN (Print)1530-1591

Other

Other2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015
CountryFrance
CityGrenoble
Period3/9/153/13/15

ASJC Scopus subject areas

  • Engineering(all)

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