Adaptive testing: Conquering process variations

Ender Yilmaz, Sule Ozev, Ozgur Sinanoglu, Peter Maxwell

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Increasing process variations result in increasing statistical diversity in manufactured devices. Test plans that are developed without this diversity in mind are bound to result in poor test quality/yield and/or long test times. Adaptive testing is a general term that is used to tailor the test strategy to accommodate a wide range of variation in the statistical characteristics of manufactured devices. In this paper, we provide a review of the key works in both digital and analog domains.

Original languageEnglish (US)
Title of host publicationProceedings - 2012 17th IEEE European Test Symposium, ETS 2012
DOIs
StatePublished - 2012
Event2012 17th IEEE European Test Symposium, ETS 2012 - Annecy, France
Duration: May 28 2012Jun 1 2012

Publication series

NameProceedings - 2012 17th IEEE European Test Symposium, ETS 2012

Other

Other2012 17th IEEE European Test Symposium, ETS 2012
CountryFrance
CityAnnecy
Period5/28/126/1/12

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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