Adaptive testing of chips with varying distributions of unknown response bits

Chandra K.H. Suresh, Ozgur Sinanoglu, Sule Ozev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Traditionally, test patterns that are generated for a given circuit are applied in an identical manner to all manufactured devices. With increasing process variations, the statistical diversity of manufactured devices is increasing, making such one-size-fits-all approaches increasingly inefficient, and resulting in yield and quality loss. Adaptive test techniques address this problem by tailoring the test decisions for the statistical characteristics of the device under test. In this paper, we present several adaptive strategies to enable adaptive unknown bit masking so as to ensure no yield loss while attaining the maximum test quality based on tester memory constraints.

Original languageEnglish (US)
Title of host publicationProceedings - 2012 17th IEEE European Test Symposium, ETS 2012
DOIs
StatePublished - 2012
Event2012 17th IEEE European Test Symposium, ETS 2012 - Annecy, France
Duration: May 28 2012Jun 1 2012

Publication series

NameProceedings - 2012 17th IEEE European Test Symposium, ETS 2012

Other

Other2012 17th IEEE European Test Symposium, ETS 2012
CountryFrance
CityAnnecy
Period5/28/126/1/12

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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