TY - GEN
T1 - Adaptive testing of chips with varying distributions of unknown response bits
AU - Suresh, Chandra K.H.
AU - Sinanoglu, Ozgur
AU - Ozev, Sule
PY - 2012
Y1 - 2012
N2 - Traditionally, test patterns that are generated for a given circuit are applied in an identical manner to all manufactured devices. With increasing process variations, the statistical diversity of manufactured devices is increasing, making such one-size-fits-all approaches increasingly inefficient, and resulting in yield and quality loss. Adaptive test techniques address this problem by tailoring the test decisions for the statistical characteristics of the device under test. In this paper, we present several adaptive strategies to enable adaptive unknown bit masking so as to ensure no yield loss while attaining the maximum test quality based on tester memory constraints.
AB - Traditionally, test patterns that are generated for a given circuit are applied in an identical manner to all manufactured devices. With increasing process variations, the statistical diversity of manufactured devices is increasing, making such one-size-fits-all approaches increasingly inefficient, and resulting in yield and quality loss. Adaptive test techniques address this problem by tailoring the test decisions for the statistical characteristics of the device under test. In this paper, we present several adaptive strategies to enable adaptive unknown bit masking so as to ensure no yield loss while attaining the maximum test quality based on tester memory constraints.
UR - http://www.scopus.com/inward/record.url?scp=84864693840&partnerID=8YFLogxK
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U2 - 10.1109/ETS.2012.6233023
DO - 10.1109/ETS.2012.6233023
M3 - Conference contribution
AN - SCOPUS:84864693840
SN - 9781467306973
T3 - Proceedings - 2012 17th IEEE European Test Symposium, ETS 2012
BT - Proceedings - 2012 17th IEEE European Test Symposium, ETS 2012
T2 - 2012 17th IEEE European Test Symposium, ETS 2012
Y2 - 28 May 2012 through 1 June 2012
ER -