TY - GEN
T1 - Advancing Atomic Force Microscopy Tips with 3D Design Control and Reduced Hamaker Constant
AU - Glia, Ayoub
AU - Deliorman, Muhammedin
AU - Qasaimeh, Mohammad A.
N1 - Funding Information:
We acknowledge the technical support from NYU Abu Dhabi Core Technology Platforms. A.G. acknowledges the NYU Abu Dhabi Global PhD Fellowship. M.A.Q. acknowledges financial support from NYU Abu Dhabi, UAE.
Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - In this work, we deploy two-photon polymerization (2PP) technique for generating multipurpose polymer-based atomic force microscopy (AFM) tips, referred to as 3DTIPs, with great flexibility in design and function. With the rationale that 3DTIPs could complement or even substitute conventional silicon tips, we show that when compared, the 3DTIPs prove effective in obtaining high resolution, high speed AFM images in air and liquid using common AFM modes. In particular, we demonstrate that the 3DTIPs provide high resolution imaging due to their extremely low Hamaker constant, high speed scanning rates due to their low quality factor, and high durability due to their soft nature and minimal isotropic tip wear, the three important features for advancing the imaging with next generation AFM tips. We also show that, refining the tip end of the 3DTIPs by carbon nanotube inclusion substantially extends their functionality in high resolution AFM imaging, reaching angstrom scales. Altogether, multifunctional capabilities of 3DTIPs have potential to substitute conventional silicon tips for effectively performing various AFM applications.
AB - In this work, we deploy two-photon polymerization (2PP) technique for generating multipurpose polymer-based atomic force microscopy (AFM) tips, referred to as 3DTIPs, with great flexibility in design and function. With the rationale that 3DTIPs could complement or even substitute conventional silicon tips, we show that when compared, the 3DTIPs prove effective in obtaining high resolution, high speed AFM images in air and liquid using common AFM modes. In particular, we demonstrate that the 3DTIPs provide high resolution imaging due to their extremely low Hamaker constant, high speed scanning rates due to their low quality factor, and high durability due to their soft nature and minimal isotropic tip wear, the three important features for advancing the imaging with next generation AFM tips. We also show that, refining the tip end of the 3DTIPs by carbon nanotube inclusion substantially extends their functionality in high resolution AFM imaging, reaching angstrom scales. Altogether, multifunctional capabilities of 3DTIPs have potential to substitute conventional silicon tips for effectively performing various AFM applications.
UR - http://www.scopus.com/inward/record.url?scp=85139077686&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85139077686&partnerID=8YFLogxK
U2 - 10.1109/MARSS55884.2022.9870484
DO - 10.1109/MARSS55884.2022.9870484
M3 - Conference contribution
AN - SCOPUS:85139077686
T3 - Proceedings of MARSS 2022 - 5th International Conference on Manipulation, Automation, and Robotics at Small Scales
BT - Proceedings of MARSS 2022 - 5th International Conference on Manipulation, Automation, and Robotics at Small Scales
A2 - Haliyo, Sinan
A2 - Boudaoud, Mokrane
A2 - Diller, Eric
A2 - Liu, Xinyu
A2 - Sun, Yu
A2 - Fatikow, Sergej
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 5th International Conference on Manipulation, Automation, and Robotics at Small Scales, MARSS 2022
Y2 - 25 July 2022 through 29 July 2022
ER -