TY - GEN
T1 - Align-Encode with XOR-based decompressors
AU - Al-Awadhi, Nader
AU - Sinanoglu, Ozgur
AU - Al-Mulla, Mohammed
PY - 2009
Y1 - 2009
N2 - The increasing size and complexity of integrated circuits result in unbearable test costs due to the consequent expansion of test data. While test stimulus compression helps reduce test time and data volume, and thus alleviates test costs, the delivery of certain test vectors may not be possible in the presence of a decompressor, leading to test quality degradation. Whether a test vector is encodable in the presence of a decompressor strongly hinges on the distribution of its care bits. Utilization of techniques, such as Align-Encode, that manipulate the distribution of care bits, thus improves test pattern encodability. The reconfigura-bility of Align-Encode provides a test pattern independent solution, wherein any given test vector can be analyzed to manipulate its care bit distribution. Manipulation of care bit distribution is attained by delaying the scan-in operation in judiciously selected scan chains. While Align-Encode has been proven to be beneficial when utilized in conjunction with fan-out decompressors, in this paper, we present the encodability enhancement delivered by Align-Encode when utilized in conjunction with XOR-based decompressors. We tackle the challenging delay information computation problem by implementing effective algorithms, enabling significant test quality improvements and/or test cost reductions.
AB - The increasing size and complexity of integrated circuits result in unbearable test costs due to the consequent expansion of test data. While test stimulus compression helps reduce test time and data volume, and thus alleviates test costs, the delivery of certain test vectors may not be possible in the presence of a decompressor, leading to test quality degradation. Whether a test vector is encodable in the presence of a decompressor strongly hinges on the distribution of its care bits. Utilization of techniques, such as Align-Encode, that manipulate the distribution of care bits, thus improves test pattern encodability. The reconfigura-bility of Align-Encode provides a test pattern independent solution, wherein any given test vector can be analyzed to manipulate its care bit distribution. Manipulation of care bit distribution is attained by delaying the scan-in operation in judiciously selected scan chains. While Align-Encode has been proven to be beneficial when utilized in conjunction with fan-out decompressors, in this paper, we present the encodability enhancement delivered by Align-Encode when utilized in conjunction with XOR-based decompressors. We tackle the challenging delay information computation problem by implementing effective algorithms, enabling significant test quality improvements and/or test cost reductions.
KW - Design-for-testability
KW - Test compression
KW - VLSI CAD
KW - VLSI testing
UR - http://www.scopus.com/inward/record.url?scp=74549150014&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=74549150014&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:74549150014
SN - 9780889867901
T3 - Proceedings of the IASTED International Conference on Advances in Computer Science and Engineering, ACSE 2009
SP - 187
EP - 192
BT - Proceedings of the IASTED International Conference on Advances in Computer Science and Engineering, ACSE 2009
T2 - IASTED International Conference on Advances in Computer Science and Engineering, ACSE 2009
Y2 - 16 March 2009 through 18 March 2009
ER -