Amplitude-normalized decay integral: A method for measuring low-level luminescence lifetimes

S. Arnold, N. Wotherspoon

Research output: Contribution to journalArticlepeer-review

Abstract

A method which utilizes photon counting is developed for measuring low-level luminescence lifetimes. The technique requires two counters and a pulse sequence generator. The method is applied to the measurement of the delayed fluorescence lifetimes in anthracene and tetracene single crystals. The lifetime of triplet excitons in vapor-grown tetracene crystals is found to be 43 μsec.

Original languageEnglish (US)
Pages (from-to)751-753
Number of pages3
JournalReview of Scientific Instruments
Volume47
Issue number6
DOIs
StatePublished - 1976

ASJC Scopus subject areas

  • Instrumentation

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