| Original language | English (US) |
|---|---|
| Title of host publication | Proceedings of Lucent Conference on Electronic Testing. April 1998. Princeton, NJ |
| Pages | 910-917 |
| State | Published - 1998 |
An integrated approach to on-line/off-line BIST
Ramesh Karri, N Mukherjee
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution