An integrated approach to on-line/off-line BIST

Ramesh Karri, N Mukherjee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publicationProceedings of Lucent Conference on Electronic Testing. April 1998. Princeton, NJ
Pages910-917
StatePublished - 1998

Cite this

Karri, R., & Mukherjee, N. (1998). An integrated approach to on-line/off-line BIST. In Proceedings of Lucent Conference on Electronic Testing. April 1998. Princeton, NJ (pp. 910-917)