@inproceedings{108b1626ae7e47a0afe0b8aa0aa4e936,
title = "An Integrated Testbed for Trojans in Printed Circuit Boards with Fuzzing Capabilities",
abstract = "This paper showcases an all-in-one testing environment that combines Trojan detection and fuzzing capabilities for printed circuit boards using the OpenPLC 'NYU Trojan Edition' and a dedicated Trojan detection framework. The demo system is self-contained and equipped with two OpenPLC-based boards (one with a Trojan and one without), and automated tools for inserting the Trojan and collecting side-channel data. We developed a graphical user interface for interactive Trojan selection, data visualization, and anomaly detection analysis.",
keywords = "anomaly detection, golden-free, machine learning, PCB, timing loopback, Trojan detection",
author = "Prashanth Krishnamurthy and Hammond Pearce and Surabhi, {Virinchi Roy} and Joshua Trujillo and Ramesh Karri and Farshad Khorrami",
note = "Funding Information: P. Krishnamurthy, H. Pearce, V. R. Surabhi, R. Karri, and F. Khor-rami are with the Department of Electrical and Computer Engineering, NYU Tandon School of Engineering, Brooklyn, NY, 11201 USA. emails: {prashanth.krishnamurthy, hammond.pearce, virinchi.roy, rkarri, khor-rami}@nyu.edu. J. Trujillo is with the Department of Energy{\textquoteright}s Kansas City National Security Campus (email: jtrujillo@kcnsc.doe.gov). This work was supported in part by DoE Kansas City. Honeywell Federal Manufacturing & Technologies, LLC operates the Kansas City National Security Campus for the United States Department of Energy / National Nuclear Security Administration under Contract Number DE-NA0002839. Publisher Copyright: {\textcopyright} 2023 IEEE.; 29th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2023 ; Conference date: 03-07-2023 Through 05-07-2023",
year = "2023",
doi = "10.1109/IOLTS59296.2023.10224878",
language = "English (US)",
series = "Proceedings - 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design, IOLTS 2023",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
editor = "Alessandro Savino and Mihalis Maniatakos and {di Carlo}, Stefano and Dimitris Gizopoulos",
booktitle = "Proceedings - 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design, IOLTS 2023",
}