Analysis of grain structure in partially ordered block copolymers by depolarized light scattering and transmission electron microscopy

M. Y. Chang; F. M. Abuzaina; W. G. Kim; J. P. Gupton; B. A. Garetz; M. C. Newstein; N. P. Balsara; L. Yang; S. P. Gido; R. E. Cohen; Y. Boontongkong; A. Bellare

doi:10.1021/ma0201025

Analysis of grain structure in partially ordered block copolymers by depolarized light scattering and transmission electron microscopy

M. Y. Chang, F. M. Abuzaina, W. G. Kim, J. P. Gupton, B. A. Garetz, M. C. Newstein, N. P. Balsara, L. Yang, S. P. Gido, R. E. Cohen, Y. Boontongkong, A. Bellare

Chemical and Biomolecular Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

The grain structure in lamellar block copolymer samples undergoing a disorder-to-order transition was studied by a combination of depolarized light scattering (DPLS) and transmission electron microscopy (TEM). The 4-fold symmetry of the DPLS profiles indicated the presence of anisotropic grains. A pattern recognition algorithm for analyzing the TEM micrographs of samples partially filled with anisotropic, ordered grains was developed. The volume fractions of sample occupied by ordered grains determined from light scattering and electron microscopy are in reasonable agreement. Both methods indicate that, on average, the characteristic length of the grains in the direction perpendicular to the lamellar planes was a factor of 2 larger than that in the plane of the lamellae. The absolute magnitudes of grain sizes determined by light scattering are about 50% larger than those determined by microscopy.

Original language	English (US)
Pages (from-to)	4437-4447
Number of pages	11
Journal	Macromolecules
Volume	35
Issue number	11
DOIs	https://doi.org/10.1021/ma0201025
State	Published - May 21 2002

ASJC Scopus subject areas

Organic Chemistry
Polymers and Plastics
Inorganic Chemistry
Materials Chemistry

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10.1021/ma0201025

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Chang, M. Y., Abuzaina, F. M., Kim, W. G., Gupton, J. P., Garetz, B. A., Newstein, M. C., Balsara, N. P., Yang, L., Gido, S. P., Cohen, R. E., Boontongkong, Y., & Bellare, A. (2002). Analysis of grain structure in partially ordered block copolymers by depolarized light scattering and transmission electron microscopy. Macromolecules, 35(11), 4437-4447. https://doi.org/10.1021/ma0201025

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title = "Analysis of grain structure in partially ordered block copolymers by depolarized light scattering and transmission electron microscopy",

abstract = "The grain structure in lamellar block copolymer samples undergoing a disorder-to-order transition was studied by a combination of depolarized light scattering (DPLS) and transmission electron microscopy (TEM). The 4-fold symmetry of the DPLS profiles indicated the presence of anisotropic grains. A pattern recognition algorithm for analyzing the TEM micrographs of samples partially filled with anisotropic, ordered grains was developed. The volume fractions of sample occupied by ordered grains determined from light scattering and electron microscopy are in reasonable agreement. Both methods indicate that, on average, the characteristic length of the grains in the direction perpendicular to the lamellar planes was a factor of 2 larger than that in the plane of the lamellae. The absolute magnitudes of grain sizes determined by light scattering are about 50% larger than those determined by microscopy.",

author = "Chang, {M. Y.} and Abuzaina, {F. M.} and Kim, {W. G.} and Gupton, {J. P.} and Garetz, {B. A.} and Newstein, {M. C.} and Balsara, {N. P.} and L. Yang and Gido, {S. P.} and Cohen, {R. E.} and Y. Boontongkong and A. Bellare",

year = "2002",

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doi = "10.1021/ma0201025",

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TY - JOUR

T1 - Analysis of grain structure in partially ordered block copolymers by depolarized light scattering and transmission electron microscopy

AU - Chang, M. Y.

AU - Abuzaina, F. M.

AU - Kim, W. G.

AU - Gupton, J. P.

AU - Garetz, B. A.

AU - Newstein, M. C.

AU - Balsara, N. P.

AU - Yang, L.

AU - Gido, S. P.

AU - Cohen, R. E.

AU - Boontongkong, Y.

AU - Bellare, A.

PY - 2002/5/21

Y1 - 2002/5/21

N2 - The grain structure in lamellar block copolymer samples undergoing a disorder-to-order transition was studied by a combination of depolarized light scattering (DPLS) and transmission electron microscopy (TEM). The 4-fold symmetry of the DPLS profiles indicated the presence of anisotropic grains. A pattern recognition algorithm for analyzing the TEM micrographs of samples partially filled with anisotropic, ordered grains was developed. The volume fractions of sample occupied by ordered grains determined from light scattering and electron microscopy are in reasonable agreement. Both methods indicate that, on average, the characteristic length of the grains in the direction perpendicular to the lamellar planes was a factor of 2 larger than that in the plane of the lamellae. The absolute magnitudes of grain sizes determined by light scattering are about 50% larger than those determined by microscopy.

AB - The grain structure in lamellar block copolymer samples undergoing a disorder-to-order transition was studied by a combination of depolarized light scattering (DPLS) and transmission electron microscopy (TEM). The 4-fold symmetry of the DPLS profiles indicated the presence of anisotropic grains. A pattern recognition algorithm for analyzing the TEM micrographs of samples partially filled with anisotropic, ordered grains was developed. The volume fractions of sample occupied by ordered grains determined from light scattering and electron microscopy are in reasonable agreement. Both methods indicate that, on average, the characteristic length of the grains in the direction perpendicular to the lamellar planes was a factor of 2 larger than that in the plane of the lamellae. The absolute magnitudes of grain sizes determined by light scattering are about 50% larger than those determined by microscopy.

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EP - 4447

JO - Macromolecules

JF - Macromolecules

IS - 11

ER -

Analysis of grain structure in partially ordered block copolymers by depolarized light scattering and transmission electron microscopy

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