| Original language | English (US) |
|---|---|
| Title of host publication | Proceedings of the Government Microcircuit Applications and Critical Technology |
| State | Published - Mar 2012 |
Applying IC testing concepts to secure ICs
Jeyavijayan Rajendran, Y Pino, Ozgur Sinanoglu, Ramesh Karri
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution