Artifact detection and correction in EEG data: A review

Sari Sadiya, Tuka Alhanai, Mohammad M. Ghassemi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Electroencephalography (EEG) has countless applications across many of fields. However, EEG applications are limited by low signal-to-noise ratios. Multiple types of artifacts contribute to the noisiness of EEG, and many techniques have been proposed to detect and correct these artifacts. These techniques range from simply detecting and rejecting artifact ridden segments, to extracting the noise component from the EEG signal. In this paper we review a variety of recent and classical techniques for EEG data artifact detection and correction with a focus on the last half-decade. We compare the strengths and weaknesses of the approaches and conclude with proposed future directions for the field.

Original languageEnglish (US)
Title of host publication2021 10th International IEEE/EMBS Conference on Neural Engineering, NER 2021
PublisherIEEE Computer Society
Pages495-498
Number of pages4
ISBN (Electronic)9781728143378
DOIs
StatePublished - May 4 2021
Event10th International IEEE/EMBS Conference on Neural Engineering, NER 2021 - Virtual, Online, Italy
Duration: May 4 2021May 6 2021

Publication series

NameInternational IEEE/EMBS Conference on Neural Engineering, NER
Volume2021-May
ISSN (Print)1948-3546
ISSN (Electronic)1948-3554

Conference

Conference10th International IEEE/EMBS Conference on Neural Engineering, NER 2021
Country/TerritoryItaly
CityVirtual, Online
Period5/4/215/6/21

ASJC Scopus subject areas

  • Artificial Intelligence
  • Mechanical Engineering

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