Atomic force microscope studies of membranes: Surface pore structures of Diaflo ultrafiltration membranes

W. Richard Bowen; Nidal Hilal; Robert W. Lovitt; Peter M. Williams

doi:10.1006/jcis.1996.0313

Atomic force microscope studies of membranes: Surface pore structures of Diaflo ultrafiltration membranes

W. Richard Bowen, Nidal Hilal, Robert W. Lovitt, Peter M. Williams

Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

Noncontact atomic force microscopy (AFM) has been used to investigate the surface pore structure of eight Diaflo ultrafiltration membranes covering a range of nominal molecular weight cutoff (MWCO) from 3000 to 300,000 and manufactured from three different polymer types. Excellent high resolution images were obtained. Analysis of the pore images gave quantitative information on the surface pore structure, in particular the pore size distribution and surface roughness. Such data is compared to that obtained by other techniques. Noncontact AFM is a facile and informative means of studying the surface structure of porous materials such as synthetic membranes.

Original language	English (US)
Pages (from-to)	350-359
Number of pages	10
Journal	Journal of Colloid And Interface Science
Volume	180
Issue number	2
DOIs	https://doi.org/10.1006/jcis.1996.0313
State	Published - Jun 25 1996

Keywords

atomic force microscopy
pore size distribution
ultrafiltration

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Biomaterials
Surfaces, Coatings and Films
Colloid and Surface Chemistry

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10.1006/jcis.1996.0313

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abstract = "Noncontact atomic force microscopy (AFM) has been used to investigate the surface pore structure of eight Diaflo ultrafiltration membranes covering a range of nominal molecular weight cutoff (MWCO) from 3000 to 300,000 and manufactured from three different polymer types. Excellent high resolution images were obtained. Analysis of the pore images gave quantitative information on the surface pore structure, in particular the pore size distribution and surface roughness. Such data is compared to that obtained by other techniques. Noncontact AFM is a facile and informative means of studying the surface structure of porous materials such as synthetic membranes.",

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AU - Williams, Peter M.

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Atomic force microscope studies of membranes: Surface pore structures of Diaflo ultrafiltration membranes

Abstract

Keywords

ASJC Scopus subject areas

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