Atomic force microscopy study of sapphire surfaces annealed with a H 2O flux from a baffled molecular-beam epitaxy effusion cell loaded with Al(OH) 3

Michael M. Oye, Jeffrey B. Hurst, Davood Shahrjerdi, N. N. Kulkarni, A. Muller, A. L. Beck, R. Sidhu, C. K. Shih, Sanjay K. Banerjee, Joe C. Campbell, Archie L. Holmes, Terry J. Mattord, Jason M. Reifsnider

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Material Science