Abstract
The characterization of crystal interfaces and organized molecular arrays were investigated with X-ray diffraction and atomic force microscopy. The combination of interface structure characterization, kinetic measurements and bulk single crystal X-ray diffraction enabled the elucidation of the growth of crystals. The study of the molecular properties of the organized interfaces were important for developing strategies for controlling nucleation of crystalline phases and for the synthesis of specific polymorphs and thin crystalline films.
Original language | English (US) |
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Pages (from-to) | 1697-1725 |
Number of pages | 29 |
Journal | Chemical reviews |
Volume | 101 |
Issue number | 6 |
DOIs | |
State | Published - Jun 2001 |
ASJC Scopus subject areas
- General Chemistry