Calculated cross sections for the multiple ionization of krypton and chromium atoms by electron impact

H. Deutsch; K. Becker; T. D. Märk

doi:10.1002/1521-3986(200101)41:1<73::AID-CTPP73>3.0.CO;2-1

Calculated cross sections for the multiple ionization of krypton and chromium atoms by electron impact

H. Deutsch, K. Becker, T. D. Märk

Research output: Contribution to journal › Article › peer-review

Abstract

The Deutsch-Märk (DM) formalism has been used to calculate cross sections for the single-step formation of Kr^m+ (m = 2 - 18) and Cr^m+ (m = 2 - 12) ions by electron impact on the neutral atoms. Our calculated cross sections for these multiple ionization processes are compared with available experimental and other theoretical data and systematic trends in the data are highlighted.

Original language	English (US)
Pages (from-to)	73-83
Number of pages	11
Journal	Contributions to Plasma Physics
Volume	41
Issue number	1
DOIs	https://doi.org/10.1002/1521-3986(200101)41:1<73::AID-CTPP73>3.0.CO;2-1
State	Published - 2001

ASJC Scopus subject areas

Condensed Matter Physics

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10.1002/1521-3986(200101)41:1<73::AID-CTPP73>3.0.CO;2-1

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abstract = "The Deutsch-M{\"a}rk (DM) formalism has been used to calculate cross sections for the single-step formation of Krm+ (m = 2 - 18) and Crm+ (m = 2 - 12) ions by electron impact on the neutral atoms. Our calculated cross sections for these multiple ionization processes are compared with available experimental and other theoretical data and systematic trends in the data are highlighted.",

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AB - The Deutsch-Märk (DM) formalism has been used to calculate cross sections for the single-step formation of Krm+ (m = 2 - 18) and Crm+ (m = 2 - 12) ions by electron impact on the neutral atoms. Our calculated cross sections for these multiple ionization processes are compared with available experimental and other theoretical data and systematic trends in the data are highlighted.

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Calculated cross sections for the multiple ionization of krypton and chromium atoms by electron impact

Abstract

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