Calculations of absolute electron-impact ionization cross sections for molecules of technological relevance using the DM formalism

M. Probst, H. Deutsch, K. Becker, T. D. Märk

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'Calculations of absolute electron-impact ionization cross sections for molecules of technological relevance using the DM formalism'. Together they form a unique fingerprint.

Keyphrases

Pharmacology, Toxicology and Pharmaceutical Science

Chemistry

Material Science

Physics