Can Multi-Layer Microfluidic Design Methods Aid Bio-Intellectual Property Protection?

Mohammed Shayan, Sukanta Bhattacharjee, Yong Ak Song, Krishnendu Chakrabarty, Ramesh Karri

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Researchers develop bioassays by rigorously experimenting in the lab. This involves significant fiscal and skilled person-hour investment. A competitor can reverse engineer a bioassay implementation by imaging or taking a video of a biochip when in use. Thus, there is a need to protect the intellectual property (IP) rights of the bioassay developer. We introduce a novel 3D multilayer-based obfuscation to protect a biochip against reverse engineering.

Original languageEnglish (US)
Title of host publication2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
EditorsDimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages151-154
Number of pages4
ISBN (Electronic)9781728124902
DOIs
StatePublished - Jul 2019
Event25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019 - Rhodes, Greece
Duration: Jul 1 2019Jul 3 2019

Publication series

Name2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019

Conference

Conference25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
CountryGreece
CityRhodes
Period7/1/197/3/19

ASJC Scopus subject areas

  • Artificial Intelligence
  • Computer Networks and Communications
  • Hardware and Architecture
  • Safety, Risk, Reliability and Quality

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  • Cite this

    Shayan, M., Bhattacharjee, S., Song, Y. A., Chakrabarty, K., & Karri, R. (2019). Can Multi-Layer Microfluidic Design Methods Aid Bio-Intellectual Property Protection? In D. Gizopoulos, D. Alexandrescu, P. Papavramidou, & M. Maniatakos (Eds.), 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019 (pp. 151-154). [8854393] (2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IOLTS.2019.8854393