Challenges and approaches to on-chip millimeter wave antenna pattern measurements

James Murdock, Eshar Ben-Dor, Felix Gutierrez, Theodore S. Rappaport

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present two methods to remove wafer probe interference radiation from measured on-chip antenna patterns performed in a probe station environment. On-chip antenna pattern and gain measurements are affected by parasitic probe tip radiation as well as scattered energy from the metal probe station environment. In this work, we use superposition and S-parameter techniques to de-embed the effects of probe tip radiation. On-chip Dipole, Yagi, and Rhombic antennas were fabricated using standard 180nm CMOS, and radiation patterns were measured at 60 GHz. This work shows methods that improve the ability to reliably design, predict, and measure on-chip antenna patterns.

Original languageEnglish (US)
Title of host publication2011 IEEE MTT-S International Microwave Symposium, IMS 2011
DOIs
StatePublished - 2011
Event2011 IEEE MTT-S International Microwave Symposium, IMS 2011 - Baltimore, MD, United States
Duration: Jun 5 2011Jun 10 2011

Publication series

NameIEEE MTT-S International Microwave Symposium Digest
ISSN (Print)0149-645X

Other

Other2011 IEEE MTT-S International Microwave Symposium, IMS 2011
CountryUnited States
CityBaltimore, MD
Period6/5/116/10/11

Keywords

  • Antenna radiation patterns
  • CMOS process
  • de-embedding techniques
  • electromagnetic radiative interference
  • integrated antennas
  • millimeter wave antennas
  • millimeter wave integrated circuits
  • on-chip antennas
  • probe radiation

ASJC Scopus subject areas

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • Cite this

    Murdock, J., Ben-Dor, E., Gutierrez, F., & Rappaport, T. S. (2011). Challenges and approaches to on-chip millimeter wave antenna pattern measurements. In 2011 IEEE MTT-S International Microwave Symposium, IMS 2011 [5972965] (IEEE MTT-S International Microwave Symposium Digest). https://doi.org/10.1109/MWSYM.2011.5972965