Challenges and approaches to on-chip millimeter wave antenna pattern measurements

James Murdock; Eshar Ben-Dor; Felix Gutierrez; Theodore S. Rappaport

doi:10.1109/MWSYM.2011.5972965

Challenges and approaches to on-chip millimeter wave antenna pattern measurements

James Murdock, Eshar Ben-Dor, Felix Gutierrez, Theodore S. Rappaport

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We present two methods to remove wafer probe interference radiation from measured on-chip antenna patterns performed in a probe station environment. On-chip antenna pattern and gain measurements are affected by parasitic probe tip radiation as well as scattered energy from the metal probe station environment. In this work, we use superposition and S-parameter techniques to de-embed the effects of probe tip radiation. On-chip Dipole, Yagi, and Rhombic antennas were fabricated using standard 180nm CMOS, and radiation patterns were measured at 60 GHz. This work shows methods that improve the ability to reliably design, predict, and measure on-chip antenna patterns.

Original language	English (US)
Title of host publication	2011 IEEE MTT-S International Microwave Symposium, IMS 2011
DOIs	https://doi.org/10.1109/MWSYM.2011.5972965
State	Published - 2011
Event	2011 IEEE MTT-S International Microwave Symposium, IMS 2011 - Baltimore, MD, United States Duration: Jun 5 2011 → Jun 10 2011

Publication series

Name	IEEE MTT-S International Microwave Symposium Digest
ISSN (Print)	0149-645X

Other

Other	2011 IEEE MTT-S International Microwave Symposium, IMS 2011
Country/Territory	United States
City	Baltimore, MD
Period	6/5/11 → 6/10/11

Keywords

Antenna radiation patterns
CMOS process
de-embedding techniques
electromagnetic radiative interference
integrated antennas
millimeter wave antennas
millimeter wave integrated circuits
on-chip antennas
probe radiation

ASJC Scopus subject areas

Radiation
Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1109/MWSYM.2011.5972965

Cite this

Murdock, J, Ben-Dor, E, Gutierrez, F & Rappaport, TS 2011, Challenges and approaches to on-chip millimeter wave antenna pattern measurements. in 2011 IEEE MTT-S International Microwave Symposium, IMS 2011., 5972965, IEEE MTT-S International Microwave Symposium Digest, 2011 IEEE MTT-S International Microwave Symposium, IMS 2011, Baltimore, MD, United States, 6/5/11. https://doi.org/10.1109/MWSYM.2011.5972965

@inproceedings{a93738f5e1704c03a6dcb59c0e608897,

title = "Challenges and approaches to on-chip millimeter wave antenna pattern measurements",

abstract = "We present two methods to remove wafer probe interference radiation from measured on-chip antenna patterns performed in a probe station environment. On-chip antenna pattern and gain measurements are affected by parasitic probe tip radiation as well as scattered energy from the metal probe station environment. In this work, we use superposition and S-parameter techniques to de-embed the effects of probe tip radiation. On-chip Dipole, Yagi, and Rhombic antennas were fabricated using standard 180nm CMOS, and radiation patterns were measured at 60 GHz. This work shows methods that improve the ability to reliably design, predict, and measure on-chip antenna patterns.",

keywords = "Antenna radiation patterns, CMOS process, de-embedding techniques, electromagnetic radiative interference, integrated antennas, millimeter wave antennas, millimeter wave integrated circuits, on-chip antennas, probe radiation",

author = "James Murdock and Eshar Ben-Dor and Felix Gutierrez and Rappaport, {Theodore S.}",

year = "2011",

doi = "10.1109/MWSYM.2011.5972965",

language = "English (US)",

isbn = "9781612847566",

series = "IEEE MTT-S International Microwave Symposium Digest",

booktitle = "2011 IEEE MTT-S International Microwave Symposium, IMS 2011",

note = "2011 IEEE MTT-S International Microwave Symposium, IMS 2011 ; Conference date: 05-06-2011 Through 10-06-2011",

}

TY - GEN

T1 - Challenges and approaches to on-chip millimeter wave antenna pattern measurements

AU - Murdock, James

AU - Ben-Dor, Eshar

AU - Gutierrez, Felix

AU - Rappaport, Theodore S.

PY - 2011

Y1 - 2011

N2 - We present two methods to remove wafer probe interference radiation from measured on-chip antenna patterns performed in a probe station environment. On-chip antenna pattern and gain measurements are affected by parasitic probe tip radiation as well as scattered energy from the metal probe station environment. In this work, we use superposition and S-parameter techniques to de-embed the effects of probe tip radiation. On-chip Dipole, Yagi, and Rhombic antennas were fabricated using standard 180nm CMOS, and radiation patterns were measured at 60 GHz. This work shows methods that improve the ability to reliably design, predict, and measure on-chip antenna patterns.

AB - We present two methods to remove wafer probe interference radiation from measured on-chip antenna patterns performed in a probe station environment. On-chip antenna pattern and gain measurements are affected by parasitic probe tip radiation as well as scattered energy from the metal probe station environment. In this work, we use superposition and S-parameter techniques to de-embed the effects of probe tip radiation. On-chip Dipole, Yagi, and Rhombic antennas were fabricated using standard 180nm CMOS, and radiation patterns were measured at 60 GHz. This work shows methods that improve the ability to reliably design, predict, and measure on-chip antenna patterns.

KW - Antenna radiation patterns

KW - CMOS process

KW - de-embedding techniques

KW - electromagnetic radiative interference

KW - integrated antennas

KW - millimeter wave antennas

KW - millimeter wave integrated circuits

KW - on-chip antennas

KW - probe radiation

UR - http://www.scopus.com/inward/record.url?scp=80052311720&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=80052311720&partnerID=8YFLogxK

U2 - 10.1109/MWSYM.2011.5972965

DO - 10.1109/MWSYM.2011.5972965

M3 - Conference contribution

AN - SCOPUS:80052311720

SN - 9781612847566

T3 - IEEE MTT-S International Microwave Symposium Digest

BT - 2011 IEEE MTT-S International Microwave Symposium, IMS 2011

T2 - 2011 IEEE MTT-S International Microwave Symposium, IMS 2011

Y2 - 5 June 2011 through 10 June 2011

ER -

Challenges and approaches to on-chip millimeter wave antenna pattern measurements

Abstract

Publication series

Other

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this