Characterization of atomic force microscope probes at low temperatures

Alexandra Radenovic, Eva Bystrenova, Laurent Libioulle, Francesco Valle, George T. Shubeita, Sandor Kasas, Giovanni Dietler

Research output: Contribution to journalArticlepeer-review


The different types of atomic force microscopy (AFM) probes were characterized under ultrahigh vacuum conditions. A temperature dependent shift of the peak frequency was observed. It was found that the chemical treatment of uncoated cantilevers does not cause bending at low temperatures.

Original languageEnglish (US)
Pages (from-to)4210-4214
Number of pages5
JournalJournal of Applied Physics
Issue number6
StatePublished - Sep 15 2003

ASJC Scopus subject areas

  • General Physics and Astronomy


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