Characterization of atomic force microscope probes at low temperatures

Alexandra Radenovic; Eva Bystrenova; Laurent Libioulle; Francesco Valle; George T. Shubeita; Sandor Kasas; Giovanni Dietler

doi:10.1063/1.1604952

Characterization of atomic force microscope probes at low temperatures

Alexandra Radenovic, Eva Bystrenova, Laurent Libioulle, Francesco Valle, George T. Shubeita, Sandor Kasas, Giovanni Dietler

Physics

Research output: Contribution to journal › Article › peer-review

Abstract

The different types of atomic force microscopy (AFM) probes were characterized under ultrahigh vacuum conditions. A temperature dependent shift of the peak frequency was observed. It was found that the chemical treatment of uncoated cantilevers does not cause bending at low temperatures.

Original language	English (US)
Pages (from-to)	4210-4214
Number of pages	5
Journal	Journal of Applied Physics
Volume	94
Issue number	6
DOIs	https://doi.org/10.1063/1.1604952
State	Published - Sep 15 2003

ASJC Scopus subject areas

Physics and Astronomy(all)

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10.1063/1.1604952

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title = "Characterization of atomic force microscope probes at low temperatures",

abstract = "The different types of atomic force microscopy (AFM) probes were characterized under ultrahigh vacuum conditions. A temperature dependent shift of the peak frequency was observed. It was found that the chemical treatment of uncoated cantilevers does not cause bending at low temperatures.",

author = "Alexandra Radenovic and Eva Bystrenova and Laurent Libioulle and Francesco Valle and Shubeita, {George T.} and Sandor Kasas and Giovanni Dietler",

year = "2003",

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doi = "10.1063/1.1604952",

language = "English (US)",

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T1 - Characterization of atomic force microscope probes at low temperatures

AU - Radenovic, Alexandra

AU - Bystrenova, Eva

AU - Libioulle, Laurent

AU - Valle, Francesco

AU - Shubeita, George T.

AU - Kasas, Sandor

AU - Dietler, Giovanni

PY - 2003/9/15

Y1 - 2003/9/15

N2 - The different types of atomic force microscopy (AFM) probes were characterized under ultrahigh vacuum conditions. A temperature dependent shift of the peak frequency was observed. It was found that the chemical treatment of uncoated cantilevers does not cause bending at low temperatures.

AB - The different types of atomic force microscopy (AFM) probes were characterized under ultrahigh vacuum conditions. A temperature dependent shift of the peak frequency was observed. It was found that the chemical treatment of uncoated cantilevers does not cause bending at low temperatures.

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DO - 10.1063/1.1604952

M3 - Article

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VL - 94

SP - 4210

EP - 4214

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 6

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Characterization of atomic force microscope probes at low temperatures

Abstract

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