Chiroptical imaging of crystals by mueller matrix microscopy

John Freundenthal, Erica Gunn, Bart Kahr

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Mueller matrix microscopy is evaluated as a tool for characterizing the heterogeneities and anisotropies of chiroptical properties of crystalline and polycrystalline materials.

Original languageEnglish (US)
Title of host publicationLaser Science, LS 2009
PublisherOptical Society of America (OSA)
ISBN (Print)9781557528780
DOIs
StatePublished - 2009
EventLaser Science, LS 2009 - San Jose, CA, United States
Duration: Oct 11 2009Oct 15 2009

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherLaser Science, LS 2009
CountryUnited States
CitySan Jose, CA
Period10/11/0910/15/09

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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