Clotho: Proactive wearout deceleration in Chip-Multiprocessor interconnects

Arseniy Vitkovskiy; Vassos Soteriou; Paul V. Gratz

doi:10.1109/ICCD.2015.7357092

Clotho: Proactive wearout deceleration in Chip-Multiprocessor interconnects

Arseniy Vitkovskiy, Vassos Soteriou, Paul V. Gratz

Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

With advancing process technology, Chip-Multiprocessors (CMPs) are experiencing ever worsening reliability due to prolonged operational stresses. The network-on-chip that interconnects the components of CMPs is especially vulnerable to such wearout-induced failure. To tackle this ominous threat we present Clotho, a novel, wearout-Aware routing algorithm. Clotho continuously considers the stresses the on-chip interconnect experiences at runtime, along with temperature and fabrication process variation metrics, steering traffic away from locations that are most prone to Electromigration (EM)-and Hot-Carrier Injection (HCI)-induced wear. Under realistic workloads Clotho yields 66% and 8% average increases in mean time to failure for EM and HCI, respectively.

Original language	English (US)
Title of host publication	Proceedings of the 33rd IEEE International Conference on Computer Design, ICCD 2015
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	117-124
Number of pages	8
ISBN (Electronic)	9781467371650
DOIs	https://doi.org/10.1109/ICCD.2015.7357092
State	Published - Dec 14 2015
Event	33rd IEEE International Conference on Computer Design, ICCD 2015 - New York City, United States Duration: Oct 18 2015 → Oct 21 2015

Publication series

Name	Proceedings of the 33rd IEEE International Conference on Computer Design, ICCD 2015

Other

Other	33rd IEEE International Conference on Computer Design, ICCD 2015
Country/Territory	United States
City	New York City
Period	10/18/15 → 10/21/15

ASJC Scopus subject areas

Computer Graphics and Computer-Aided Design
Computer Science Applications

Access to Document

10.1109/ICCD.2015.7357092

Cite this

Vitkovskiy, A., Soteriou, V., & Gratz, P. V. (2015). Clotho: Proactive wearout deceleration in Chip-Multiprocessor interconnects. In Proceedings of the 33rd IEEE International Conference on Computer Design, ICCD 2015 (pp. 117-124). Article 7357092 (Proceedings of the 33rd IEEE International Conference on Computer Design, ICCD 2015). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICCD.2015.7357092

Clotho: Proactive wearout deceleration in Chip-Multiprocessor interconnects. / Vitkovskiy, Arseniy; Soteriou, Vassos; Gratz, Paul V.
Proceedings of the 33rd IEEE International Conference on Computer Design, ICCD 2015. Institute of Electrical and Electronics Engineers Inc., 2015. p. 117-124 7357092 (Proceedings of the 33rd IEEE International Conference on Computer Design, ICCD 2015).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Vitkovskiy, A, Soteriou, V & Gratz, PV 2015, Clotho: Proactive wearout deceleration in Chip-Multiprocessor interconnects. in Proceedings of the 33rd IEEE International Conference on Computer Design, ICCD 2015., 7357092, Proceedings of the 33rd IEEE International Conference on Computer Design, ICCD 2015, Institute of Electrical and Electronics Engineers Inc., pp. 117-124, 33rd IEEE International Conference on Computer Design, ICCD 2015, New York City, United States, 10/18/15. https://doi.org/10.1109/ICCD.2015.7357092

Vitkovskiy A, Soteriou V, Gratz PV. Clotho: Proactive wearout deceleration in Chip-Multiprocessor interconnects. In Proceedings of the 33rd IEEE International Conference on Computer Design, ICCD 2015. Institute of Electrical and Electronics Engineers Inc. 2015. p. 117-124. 7357092. (Proceedings of the 33rd IEEE International Conference on Computer Design, ICCD 2015). doi: 10.1109/ICCD.2015.7357092

Vitkovskiy, Arseniy ; Soteriou, Vassos ; Gratz, Paul V. / Clotho : Proactive wearout deceleration in Chip-Multiprocessor interconnects. Proceedings of the 33rd IEEE International Conference on Computer Design, ICCD 2015. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 117-124 (Proceedings of the 33rd IEEE International Conference on Computer Design, ICCD 2015).

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Clotho: Proactive wearout deceleration in Chip-Multiprocessor interconnects

Abstract

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