Cluster-assembled carbon films with different nanostructures: A spectroscopic study

E. Riedo, E. Magnano, S. Rubini, M. Sancrotti, E. Barborini, P. Piseri, P. Milani

Research output: Contribution to journalArticlepeer-review


Carbon thin films with different nanostructures grown by Cluster Beam Deposition are studied by means of Raman Spectroscopy, X-ray photoemission spectroscopy (XPS), and electron energy loss spectroscopy (EELS). Raman and EELS of the asgrown specimens show a correlation between the properties of the free carbon clusters and the properties of the films obtained by deposition of different sized clusters. In contrast, the inhomogeneous character of the films is not reflected in the valence band states as seen by XPS.

Original languageEnglish (US)
Pages (from-to)287-292
Number of pages6
JournalSolid State Communications
Issue number5
StatePublished - Sep 27 2000


  • A. Nanostructures
  • A. Thin films
  • D. Electronic states
  • E. Electron energy loss spectroscopy
  • E. Photoelectron spectroscopies

ASJC Scopus subject areas

  • General Chemistry
  • Condensed Matter Physics
  • Materials Chemistry


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