Cluster-assembled carbon films with different nanostructures: A spectroscopic study

E. Riedo; E. Magnano; S. Rubini; M. Sancrotti; E. Barborini; P. Piseri; P. Milani

doi:10.1016/S0038-1098(00)00325-2

Cluster-assembled carbon films with different nanostructures: A spectroscopic study

E. Riedo, E. Magnano, S. Rubini, M. Sancrotti, E. Barborini, P. Piseri, P. Milani

Chemical and Biomolecular Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

Carbon thin films with different nanostructures grown by Cluster Beam Deposition are studied by means of Raman Spectroscopy, X-ray photoemission spectroscopy (XPS), and electron energy loss spectroscopy (EELS). Raman and EELS of the asgrown specimens show a correlation between the properties of the free carbon clusters and the properties of the films obtained by deposition of different sized clusters. In contrast, the inhomogeneous character of the films is not reflected in the valence band states as seen by XPS.

Original language	English (US)
Pages (from-to)	287-292
Number of pages	6
Journal	Solid State Communications
Volume	116
Issue number	5
DOIs	https://doi.org/10.1016/S0038-1098(00)00325-2
State	Published - Sep 27 2000

Keywords

A. Nanostructures
A. Thin films
D. Electronic states
E. Electron energy loss spectroscopy
E. Photoelectron spectroscopies

ASJC Scopus subject areas

General Chemistry
Condensed Matter Physics
Materials Chemistry

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10.1016/S0038-1098(00)00325-2

Cite this

@article{80041d5f227e4409869905d9cda05893,

title = "Cluster-assembled carbon films with different nanostructures: A spectroscopic study",

abstract = "Carbon thin films with different nanostructures grown by Cluster Beam Deposition are studied by means of Raman Spectroscopy, X-ray photoemission spectroscopy (XPS), and electron energy loss spectroscopy (EELS). Raman and EELS of the asgrown specimens show a correlation between the properties of the free carbon clusters and the properties of the films obtained by deposition of different sized clusters. In contrast, the inhomogeneous character of the films is not reflected in the valence band states as seen by XPS.",

keywords = "A. Nanostructures, A. Thin films, D. Electronic states, E. Electron energy loss spectroscopy, E. Photoelectron spectroscopies",

author = "E. Riedo and E. Magnano and S. Rubini and M. Sancrotti and E. Barborini and P. Piseri and P. Milani",

note = "Funding Information: This work was funded within the Progetto Ricerca Avanzata CLASS of the INFM and the MADESS-II project of the CNR. We thank L. Diederich, C. Lenardi, C.E. Bottani, and A. Li Bassi for many clarifying discussions. We are indebted with E. Maillard-Schaller and L. Schlapbach for providing us the diamond specimen. ",

year = "2000",

month = sep,

day = "27",

doi = "10.1016/S0038-1098(00)00325-2",

language = "English (US)",

volume = "116",

pages = "287--292",

journal = "Solid State Communications",

issn = "0038-1098",

publisher = "Elsevier Limited",

number = "5",

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TY - JOUR

T1 - Cluster-assembled carbon films with different nanostructures

T2 - A spectroscopic study

AU - Riedo, E.

AU - Magnano, E.

AU - Rubini, S.

AU - Sancrotti, M.

AU - Barborini, E.

AU - Piseri, P.

AU - Milani, P.

N1 - Funding Information: This work was funded within the Progetto Ricerca Avanzata CLASS of the INFM and the MADESS-II project of the CNR. We thank L. Diederich, C. Lenardi, C.E. Bottani, and A. Li Bassi for many clarifying discussions. We are indebted with E. Maillard-Schaller and L. Schlapbach for providing us the diamond specimen.

PY - 2000/9/27

Y1 - 2000/9/27

N2 - Carbon thin films with different nanostructures grown by Cluster Beam Deposition are studied by means of Raman Spectroscopy, X-ray photoemission spectroscopy (XPS), and electron energy loss spectroscopy (EELS). Raman and EELS of the asgrown specimens show a correlation between the properties of the free carbon clusters and the properties of the films obtained by deposition of different sized clusters. In contrast, the inhomogeneous character of the films is not reflected in the valence band states as seen by XPS.

AB - Carbon thin films with different nanostructures grown by Cluster Beam Deposition are studied by means of Raman Spectroscopy, X-ray photoemission spectroscopy (XPS), and electron energy loss spectroscopy (EELS). Raman and EELS of the asgrown specimens show a correlation between the properties of the free carbon clusters and the properties of the films obtained by deposition of different sized clusters. In contrast, the inhomogeneous character of the films is not reflected in the valence band states as seen by XPS.

KW - A. Nanostructures

KW - A. Thin films

KW - D. Electronic states

KW - E. Electron energy loss spectroscopy

KW - E. Photoelectron spectroscopies

UR - http://www.scopus.com/inward/record.url?scp=0000470348&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0000470348&partnerID=8YFLogxK

U2 - 10.1016/S0038-1098(00)00325-2

DO - 10.1016/S0038-1098(00)00325-2

M3 - Article

AN - SCOPUS:0000470348

SN - 0038-1098

VL - 116

SP - 287

EP - 292

JO - Solid State Communications

JF - Solid State Communications

IS - 5

ER -

Cluster-assembled carbon films with different nanostructures: A spectroscopic study

Abstract

Keywords

ASJC Scopus subject areas

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