Combined polarized Raman and atomic force microscopy: In situ study of point defects and mechanical properties in individual ZnO nanobelts

Marcel Lucas, Zhong Lin Wang, Elisa Riedo

Research output: Contribution to journal › Article › peer-review

Fingerprint

Dive into the research topics of 'Combined polarized Raman and atomic force microscopy: In situ study of point defects and mechanical properties in individual ZnO nanobelts'. Together they form a unique fingerprint.

Physics & Astronomy