Compacting test responses for deeply embedded SoC cores

Ozgur Sinanoglu, Alex Orailoglu

Research output: Contribution to journalArticlepeer-review

Abstract

A fault-model-dependent compaction methodology that delivers the lowest possible test bandwidth with no aliasing of the modeled faults is proposed. This methodology is also computationally efficient because the aliasing analysis handles only a small subset of the faults. Subsequently, the proposed methodology is extended to scan-based cores.

Original languageEnglish (US)
Pages (from-to)22-30
Number of pages9
JournalIEEE Design and Test of Computers
Volume20
Issue number4
DOIs
StatePublished - Jul 2003

ASJC Scopus subject areas

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering

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