Compiler-driven dynamic reliability management for on-chip systems under variabilities

Semeen Rehman; Florian Kriebel; Muhammad Shafique; Jörg Henkel

doi:10.7873/DATE2014.119

Compiler-driven dynamic reliability management for on-chip systems under variabilities

Semeen Rehman, Florian Kriebel, Muhammad Shafique, Jörg Henkel

Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

This paper presents a novel Dynamic Reliability Management System (DyReMS) for on-chip systems that performs resilience-driven resource allocation and mapping. It accounts for both the tasks' resilience properties and heterogeneous error recovery features of different cores. DyReMS also chooses a reliable task version (out of multiple reliability-aware transformed options) depending upon the reliability level of the allocated core. In case of error detection, rollbacks are performed. Our system provides 70%-87% improved task reliability compared to a timing reliability-optimizing core assignment, i.e. minimizing the probability of deadline misses (with EDF scheduling).

Original language	English (US)
Title of host publication	Proceedings - Design, Automation and Test in Europe, DATE 2014
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Print)	9783981537024
DOIs	https://doi.org/10.7873/DATE2014.119
State	Published - 2014
Event	17th Design, Automation and Test in Europe, DATE 2014 - Dresden, Germany Duration: Mar 24 2014 → Mar 28 2014

Publication series

Name	Proceedings -Design, Automation and Test in Europe, DATE
ISSN (Print)	1530-1591

Other

Other	17th Design, Automation and Test in Europe, DATE 2014
Country/Territory	Germany
City	Dresden
Period	3/24/14 → 3/28/14

Keywords

Aging
Compiler
Dependability
Process Variations
Reliability
Run-Time Management
Soft Errors

ASJC Scopus subject areas

General Engineering

Access to Document

10.7873/DATE2014.119

Cite this

Rehman, S., Kriebel, F., Shafique, M., & Henkel, J. (2014). Compiler-driven dynamic reliability management for on-chip systems under variabilities. In Proceedings - Design, Automation and Test in Europe, DATE 2014 Article 6800320 (Proceedings -Design, Automation and Test in Europe, DATE). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.7873/DATE2014.119

Compiler-driven dynamic reliability management for on-chip systems under variabilities. / Rehman, Semeen; Kriebel, Florian; Shafique, Muhammad et al.
Proceedings - Design, Automation and Test in Europe, DATE 2014. Institute of Electrical and Electronics Engineers Inc., 2014. 6800320 (Proceedings -Design, Automation and Test in Europe, DATE).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Rehman, S, Kriebel, F, Shafique, M & Henkel, J 2014, Compiler-driven dynamic reliability management for on-chip systems under variabilities. in Proceedings - Design, Automation and Test in Europe, DATE 2014., 6800320, Proceedings -Design, Automation and Test in Europe, DATE, Institute of Electrical and Electronics Engineers Inc., 17th Design, Automation and Test in Europe, DATE 2014, Dresden, Germany, 3/24/14. https://doi.org/10.7873/DATE2014.119

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abstract = "This paper presents a novel Dynamic Reliability Management System (DyReMS) for on-chip systems that performs resilience-driven resource allocation and mapping. It accounts for both the tasks' resilience properties and heterogeneous error recovery features of different cores. DyReMS also chooses a reliable task version (out of multiple reliability-aware transformed options) depending upon the reliability level of the allocated core. In case of error detection, rollbacks are performed. Our system provides 70%-87% improved task reliability compared to a timing reliability-optimizing core assignment, i.e. minimizing the probability of deadline misses (with EDF scheduling).",

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AB - This paper presents a novel Dynamic Reliability Management System (DyReMS) for on-chip systems that performs resilience-driven resource allocation and mapping. It accounts for both the tasks' resilience properties and heterogeneous error recovery features of different cores. DyReMS also chooses a reliable task version (out of multiple reliability-aware transformed options) depending upon the reliability level of the allocated core. In case of error detection, rollbacks are performed. Our system provides 70%-87% improved task reliability compared to a timing reliability-optimizing core assignment, i.e. minimizing the probability of deadline misses (with EDF scheduling).

KW - Aging

KW - Compiler

KW - Dependability

KW - Process Variations

KW - Reliability

KW - Run-Time Management

KW - Soft Errors

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T3 - Proceedings -Design, Automation and Test in Europe, DATE

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PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 17th Design, Automation and Test in Europe, DATE 2014

Y2 - 24 March 2014 through 28 March 2014

ER -

Compiler-driven dynamic reliability management for on-chip systems under variabilities

Abstract

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Other

Keywords

ASJC Scopus subject areas

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