Compiler-driven dynamic reliability management for on-chip systems under variabilities

Semeen Rehman, Florian Kriebel, Muhammad Shafique, Jörg Henkel

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents a novel Dynamic Reliability Management System (DyReMS) for on-chip systems that performs resilience-driven resource allocation and mapping. It accounts for both the tasks' resilience properties and heterogeneous error recovery features of different cores. DyReMS also chooses a reliable task version (out of multiple reliability-aware transformed options) depending upon the reliability level of the allocated core. In case of error detection, rollbacks are performed. Our system provides 70%-87% improved task reliability compared to a timing reliability-optimizing core assignment, i.e. minimizing the probability of deadline misses (with EDF scheduling).

Original languageEnglish (US)
Title of host publicationProceedings - Design, Automation and Test in Europe, DATE 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9783981537024
DOIs
StatePublished - 2014
Event17th Design, Automation and Test in Europe, DATE 2014 - Dresden, Germany
Duration: Mar 24 2014Mar 28 2014

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
ISSN (Print)1530-1591

Other

Other17th Design, Automation and Test in Europe, DATE 2014
CountryGermany
CityDresden
Period3/24/143/28/14

Keywords

  • Aging
  • Compiler
  • Dependability
  • Process Variations
  • Reliability
  • Run-Time Management
  • Soft Errors

ASJC Scopus subject areas

  • Engineering(all)

Fingerprint Dive into the research topics of 'Compiler-driven dynamic reliability management for on-chip systems under variabilities'. Together they form a unique fingerprint.

Cite this