Abstract
Power density has become the major constraint for many on-chip designs. As an introduction to the Special Issue on Dark Silicon, the authors provide the newest trends and a survey on the topic that has valuable information for novices and experts alike.
Original language | English (US) |
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Article number | 7762141 |
Pages (from-to) | 8-23 |
Number of pages | 16 |
Journal | IEEE Design and Test |
Volume | 34 |
Issue number | 2 |
DOIs | |
State | Published - Apr 2017 |
ASJC Scopus subject areas
- Software
- Hardware and Architecture
- Electrical and Electronic Engineering