Cross-layer reliability modeling and optimization for embedded systems under process variations

Siddharth Garg, Puneet Gupta, Hiren D. Patel, Muhammad Shafique

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publication2013 Proceedings of the International Conference on Embedded Software, EMSOFT 2013
PublisherIEEE Computer Society
ISBN (Print)9781479914432
DOIs
StatePublished - 2013
Event13th International Conference on Embedded Software, EMSOFT 2013 - Montreal, QC, Canada
Duration: Sep 29 2013Oct 4 2013

Publication series

Name2013 Proceedings of the International Conference on Embedded Software, EMSOFT 2013

Other

Other13th International Conference on Embedded Software, EMSOFT 2013
Country/TerritoryCanada
CityMontreal, QC
Period9/29/1310/4/13

ASJC Scopus subject areas

  • Software

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