Cross-layer reliability modeling and optimization for embedded systems under process variations

Siddharth Garg, Puneet Gupta, Hiren D. Patel, Muhammad Shafique

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publication2013 International Conference on Hardware/Software Codesign and System Synthesis, CODES+ISSS 2013
PublisherIEEE Computer Society
ISBN (Print)9781479914173
DOIs
StatePublished - 2013
Event11th ACM/IEEE International Conference on Hardware/Software Codesign and System Synthesis, CODES+ISSS 2013 - Montreal, QC, Canada
Duration: Sep 29 2013Oct 4 2013

Publication series

Name2013 International Conference on Hardware/Software Codesign and System Synthesis, CODES+ISSS 2013

Other

Other11th ACM/IEEE International Conference on Hardware/Software Codesign and System Synthesis, CODES+ISSS 2013
CountryCanada
CityMontreal, QC
Period9/29/1310/4/13

ASJC Scopus subject areas

  • Hardware and Architecture
  • Software

Cite this

Garg, S., Gupta, P., Patel, H. D., & Shafique, M. (2013). Cross-layer reliability modeling and optimization for embedded systems under process variations. In 2013 International Conference on Hardware/Software Codesign and System Synthesis, CODES+ISSS 2013 [6658987] (2013 International Conference on Hardware/Software Codesign and System Synthesis, CODES+ISSS 2013). IEEE Computer Society. https://doi.org/10.1109/CODES-ISSS.2013.6658987