Cross-layer reliability modeling and optimization for embedded systems under process variations

Siddharth Garg, Puneet Gupta, Hiren D. Patel, Muhammad Shafique

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publication2013 International Conference on Compilers, Architecture and Synthesis for Embedded Systems, CASES 2013
PublisherIEEE Computer Society
ISBN (Print)9781479914005
DOIs
StatePublished - 2013
Event2013 International Conference on Compilers, Architecture and Synthesis for Embedded Systems, CASES 2013 - Montreal, QC, Canada
Duration: Sep 29 2013Oct 4 2013

Publication series

Name2013 International Conference on Compilers, Architecture and Synthesis for Embedded Systems, CASES 2013

Other

Other2013 International Conference on Compilers, Architecture and Synthesis for Embedded Systems, CASES 2013
CountryCanada
CityMontreal, QC
Period9/29/1310/4/13

ASJC Scopus subject areas

  • Hardware and Architecture
  • Control and Systems Engineering

Cite this

Garg, S., Gupta, P., Patel, H. D., & Shafique, M. (2013). Cross-layer reliability modeling and optimization for embedded systems under process variations. In 2013 International Conference on Compilers, Architecture and Synthesis for Embedded Systems, CASES 2013 [6662504] (2013 International Conference on Compilers, Architecture and Synthesis for Embedded Systems, CASES 2013). IEEE Computer Society. https://doi.org/10.1109/CASES.2013.6662504