Cross-layer reliability modeling and optimization for embedded systems under process variations

S. Garg, P. Gupta, H.D. Patel, M. Shafique

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageUndefined
Title of host publication2013 International Conference on Compilers, Architecture and Synthesis for Embedded Systems, CASES 2013
DOIs
StatePublished - 2013

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