TY - JOUR
T1 - Deep Learning Analysis for Split-Manufactured Layouts with Routing Perturbation
AU - Li, Haocheng
AU - Patnaik, Satwik
AU - Ashraf, Mohammed
AU - Yang, Haoyu
AU - Knechtel, Johann
AU - Yu, Bei
AU - Sinanoglu, Ozgur
AU - Young, Evangeline F.Y.
N1 - Funding Information:
Manuscript received March 11, 2020; revised June 19, 2020 and September 12, 2020; accepted October 17, 2020. Date of publication November 11, 2020; date of current version September 20, 2021. This work was supported in part by the Research Grants Council of the Hong Kong Special Administrative Region, China, under Project CUHK14202218; in part by the Center for Cyber Security at New York University Abu Dhabi (NYUAD); in part by the NYUAD REF Program; and in part by the HPC Facility at NYUAD. The work of Satwik Patnaik was supported by the Global Ph.D. Fellowship at NYU/NYUAD. This work is an extension of [1]. This article was recommended by Associate Editor I. H. R. Jiang. (Corresponding authors: Haocheng Li; Satwik Patnaik.) Haocheng Li, Haoyu Yang, Bei Yu, and Evangeline F.Y. Young are with the Department of Computer Science and Engineering, Chinese University of Hong Kong, Hong Kong (e-mail: hcli@cse.cuhk.edu.hk; hyyang@cse.cuhk.edu.hk; byu@cse.cuhk.edu.hk; fyyoung@cse.cuhk.edu.hk).
Publisher Copyright:
© 1982-2012 IEEE.
PY - 2021/10
Y1 - 2021/10
N2 - Split manufacturing of integrated circuits means to delegate the front-end-of-line (FEOL) and back-end-of-line (BEOL) parts to different foundries, in order to prevent overproduction, intellectual property (IP) piracy, or targeted insertion of hardware Trojans (i.e., threats arising from adversaries in the FEOL foundry). This article challenges the security promise of split manufacturing by formulating various layout-level placement and routing hints as vector-based and image-based features that enable a sophisticated deep neural network (DNN), which can infer the missing BEOL connections with high accuracy. Compared with the network-flow attack (Wang et al., 2018), we achieve on average $1.21 \times $ and $1.12 \times $ of their correct connection rate (CCR; the higher, the better) when splitting after M1 and M3, respectively, with less than 1% of their runtime (across the same set of ISCAS-85 and ITC-99 benchmarks). Compared with Zeng et al. (2019), ours reduces the candidate list (the smaller, the better) by 47% with only 1% loss of accuracy, and we further achieve an average CCR of $2.2 \times $ of that of Zeng et al. (2019). Aside from these superior results, we propose a randomized, routing-blockage-centric defense strategy to escalate the resilience against our and other attacks. Our defense strategy, which can be integrated into any commercial design flow, leads on average to $22.78~pp$ (percentage points) degradation in CCR when compared with unprotected layouts, while inducing only 3.3% and 3.2% overheads on power and timing, respectively, within the same die outlines (i.e., zero area cost). The source code of our heterogeneous feature extraction is available at https://github.com/cuhk-eda/split-extract, and the source code of our DNN is available at https://github.com/cuhk-eda/split-attack.
AB - Split manufacturing of integrated circuits means to delegate the front-end-of-line (FEOL) and back-end-of-line (BEOL) parts to different foundries, in order to prevent overproduction, intellectual property (IP) piracy, or targeted insertion of hardware Trojans (i.e., threats arising from adversaries in the FEOL foundry). This article challenges the security promise of split manufacturing by formulating various layout-level placement and routing hints as vector-based and image-based features that enable a sophisticated deep neural network (DNN), which can infer the missing BEOL connections with high accuracy. Compared with the network-flow attack (Wang et al., 2018), we achieve on average $1.21 \times $ and $1.12 \times $ of their correct connection rate (CCR; the higher, the better) when splitting after M1 and M3, respectively, with less than 1% of their runtime (across the same set of ISCAS-85 and ITC-99 benchmarks). Compared with Zeng et al. (2019), ours reduces the candidate list (the smaller, the better) by 47% with only 1% loss of accuracy, and we further achieve an average CCR of $2.2 \times $ of that of Zeng et al. (2019). Aside from these superior results, we propose a randomized, routing-blockage-centric defense strategy to escalate the resilience against our and other attacks. Our defense strategy, which can be integrated into any commercial design flow, leads on average to $22.78~pp$ (percentage points) degradation in CCR when compared with unprotected layouts, while inducing only 3.3% and 3.2% overheads on power and timing, respectively, within the same die outlines (i.e., zero area cost). The source code of our heterogeneous feature extraction is available at https://github.com/cuhk-eda/split-extract, and the source code of our DNN is available at https://github.com/cuhk-eda/split-attack.
KW - Deep learning (DL)
KW - feature extraction
KW - hardware security
KW - intellectual property (IP) protection
KW - routing perturbation
KW - split manufacturing
KW - very large scale integration (VLSI)
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U2 - 10.1109/TCAD.2020.3037297
DO - 10.1109/TCAD.2020.3037297
M3 - Article
AN - SCOPUS:85096368396
SN - 0278-0070
VL - 40
SP - 1995
EP - 2008
JO - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
JF - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IS - 10
ER -