Deep Learning with Feature Reuse for JPEG Image Steganalysis

Jianhua Yang, Xiangui Kang, Edward K. Wong, Yun Qing Shi

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    It is challenging to detect weak hidden information in a JPEG compressed image. In this paper, we propose a 32-layer convolutional neural networks (CNNs) with feature reuse by concatenating all features from previous layers. The proposed method can improve the flow of gradient and information, and the shared features and bottleneck layers in the proposed CNN model further reduce the number of parameters dramatically. The experimental results shown that the proposed method significantly reduce the detection error rate compared with the existing JPEG steganalysis methods, e.g. state-of-the-art XuNet method and the conventional SCA-GFR method. Compared with XuNet method and conventional method SCA-GFR in detecting J-UNIWARD at 0.1 bpnzAC (bit per non-zero AC DCT coefficient), the proposed method can reduce detection error rate by 4.33% and 6.55% respectively.

    Original languageEnglish (US)
    Title of host publication2018 Asia-Pacific Signal and Information Processing Association Annual Summit and Conference, APSIPA ASC 2018 - Proceedings
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages533-538
    Number of pages6
    ISBN (Electronic)9789881476852
    DOIs
    StatePublished - Jul 2 2018
    Event10th Asia-Pacific Signal and Information Processing Association Annual Summit and Conference, APSIPA ASC 2018 - Honolulu, United States
    Duration: Nov 12 2018Nov 15 2018

    Publication series

    Name2018 Asia-Pacific Signal and Information Processing Association Annual Summit and Conference, APSIPA ASC 2018 - Proceedings

    Conference

    Conference10th Asia-Pacific Signal and Information Processing Association Annual Summit and Conference, APSIPA ASC 2018
    Country/TerritoryUnited States
    CityHonolulu
    Period11/12/1811/15/18

    ASJC Scopus subject areas

    • Information Systems

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