TY - GEN
T1 - Detecting malicious modifications of data in third-party intellectual property cores
AU - Rajendran, Jeyavijayan
AU - Vedula, VivekAnanda
AU - Karri, Ramesh
PY - 2015/7/24
Y1 - 2015/7/24
N2 - Globalization of the system-on-chIP (SoC) design flow has created opportunities for rogue elements in the intellectual property (IP) vendor companies to insert malicious circuits (a.k.a. hardware Trojans) into their IPs. We propose to formally verify third party IPs (3PIPs) for unauthorized corruption of critical data such as secret key. Our approach develops properties to identify corruption of critical registers. Furthermore, we describe two attacks where computations can be performed on corrupted data without corrupting the critical register. We develop additional properties to detect such attacks. We validate our technique using Trojans in 8051 and RISC processors and AES designs from Trust-Hub.
AB - Globalization of the system-on-chIP (SoC) design flow has created opportunities for rogue elements in the intellectual property (IP) vendor companies to insert malicious circuits (a.k.a. hardware Trojans) into their IPs. We propose to formally verify third party IPs (3PIPs) for unauthorized corruption of critical data such as secret key. Our approach develops properties to identify corruption of critical registers. Furthermore, we describe two attacks where computations can be performed on corrupted data without corrupting the critical register. We develop additional properties to detect such attacks. We validate our technique using Trojans in 8051 and RISC processors and AES designs from Trust-Hub.
UR - http://www.scopus.com/inward/record.url?scp=84944111585&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84944111585&partnerID=8YFLogxK
U2 - 10.1145/2744769.2744823
DO - 10.1145/2744769.2744823
M3 - Conference contribution
AN - SCOPUS:84944111585
T3 - Proceedings - Design Automation Conference
BT - 2015 52nd ACM/EDAC/IEEE Design Automation Conference, DAC 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 52nd ACM/EDAC/IEEE Design Automation Conference, DAC 2015
Y2 - 8 June 2015 through 12 June 2015
ER -