Direct measurement of inversion charge density in enhancement-mode GaAs and InP field-effect transistors with AI203 gate dielectric using gated-hall-bar-structures

Davood Shahrjerdi, B. Hekmatshoar, J. Nah, Emanuel Tutuc, Sanjay K. Banerjee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publicationMaterial Research Society Spring Meeting, 2011
StatePublished - 2011

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