Abstract
We have made measurements of the local potential distribution and topography of current carrying Y1Ba2Cu3O6.9 thin films using a scanning tunneling microscope. We have compared the electrostatic potential distribution in the normal state on post-annealed thin films and in-situ prepared films. On post-annealed films we find steps in the potential image indicative of insulating boundaries in the material which occur at boundaries between clusters of grains whereas the in-situ films show a nearly uniform potential drop. These results provide a clear indication of the nature of disorder in these thin films and what length scale ultimately determines the microscopic resistivity.
Original language | English (US) |
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Pages (from-to) | 1035-1036 |
Number of pages | 2 |
Journal | Physica C: Superconductivity and its applications |
Volume | 162-164 |
Issue number | PART 2 |
DOIs | |
State | Published - Dec 1989 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering